Average Ratings 0 Ratings
Average Ratings 0 Ratings
Description
Elements® is a metrology software that operates in a 2D CAD environment, making it perfectly suited for measuring components with a high density of features. It facilitates the creation of measurement routines directly from 2D CAD files, streamlining the process significantly. Moreover, it smartly optimizes measurement paths to enhance the speed at which data is collected. The true benefit of Elements lies in its ability to efficiently manage a large quantity of discrete features without compromising on accuracy. Users can import various CAD formats, including DXF, Gerber, and CSV location lists. An advanced review mode is available, enabling real-time visual inspection of specific features once a measurement run has concluded. Additionally, the coarse alignment feature allows for real-time adjustments of finders, improving measurement precision. The software comes equipped with sophisticated analysis tools that make it easy to interpret extensive data trends. These analytical features encompass scatter plots, histograms reflecting dimensional values, and whisker plots that illustrate deviations from the nominal values. Ultimately, it is essential to assess your measurement needs thoroughly and select the solution that aligns best with your requirements. The comprehensive capabilities of Elements® ensure that users can achieve reliable and accurate measurement results efficiently.
Description
VMS™ is an advanced 2½ D metrology software that integrates robust parametric programming along with built-in scripting to facilitate the development of tailored routines and user interfaces. This software boasts extensive features that enable it to effectively manage challenging lighting scenarios, faint edges, and variations between parts. The Area Multi-Focus (AMF) feature generates a high-resolution 3D dataset from a standard autofocus operation, providing a rapid alternative to traditional laser surface scanning methods. Additionally, the Continuous Image Capture (CIC) functionality aligns illumination with the acquisition of camera frames and movement of the XY stage, enabling the collection of video images during stage motion. Furthermore, the software supports native video® processing, allowing users to analyze stored images with the same tools used for live captures, ensuring consistency in data evaluation. This versatility makes VMS™ a powerful solution for a wide range of metrology applications.
API Access
Has API
API Access
Has API
Integrations
Gerber AccuMark 3D
Pricing Details
No price information available.
Free Trial
Free Version
Pricing Details
No price information available.
Free Trial
Free Version
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Vendor Details
Company Name
OGP
Founded
1945
Country
United States
Website
www.ogpnet.com/products/software/metrology-software/elements/
Vendor Details
Company Name
OGP
Founded
1945
Country
United States
Website
www.ogpnet.com/products/software/metrology-software/vms/