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Average Ratings 0 Ratings

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ease
features
design
support

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Description

Elements® is a metrology software that operates in a 2D CAD environment, making it perfectly suited for measuring components with a high density of features. It facilitates the creation of measurement routines directly from 2D CAD files, streamlining the process significantly. Moreover, it smartly optimizes measurement paths to enhance the speed at which data is collected. The true benefit of Elements lies in its ability to efficiently manage a large quantity of discrete features without compromising on accuracy. Users can import various CAD formats, including DXF, Gerber, and CSV location lists. An advanced review mode is available, enabling real-time visual inspection of specific features once a measurement run has concluded. Additionally, the coarse alignment feature allows for real-time adjustments of finders, improving measurement precision. The software comes equipped with sophisticated analysis tools that make it easy to interpret extensive data trends. These analytical features encompass scatter plots, histograms reflecting dimensional values, and whisker plots that illustrate deviations from the nominal values. Ultimately, it is essential to assess your measurement needs thoroughly and select the solution that aligns best with your requirements. The comprehensive capabilities of Elements® ensure that users can achieve reliable and accurate measurement results efficiently.

Description

VMS™ is an advanced 2½ D metrology software that integrates robust parametric programming along with built-in scripting to facilitate the development of tailored routines and user interfaces. This software boasts extensive features that enable it to effectively manage challenging lighting scenarios, faint edges, and variations between parts. The Area Multi-Focus (AMF) feature generates a high-resolution 3D dataset from a standard autofocus operation, providing a rapid alternative to traditional laser surface scanning methods. Additionally, the Continuous Image Capture (CIC) functionality aligns illumination with the acquisition of camera frames and movement of the XY stage, enabling the collection of video images during stage motion. Furthermore, the software supports native video® processing, allowing users to analyze stored images with the same tools used for live captures, ensuring consistency in data evaluation. This versatility makes VMS™ a powerful solution for a wide range of metrology applications.

API Access

Has API

API Access

Has API

Screenshots View All

Screenshots View All

Integrations

Gerber AccuMark 3D

Integrations

Gerber AccuMark 3D

Pricing Details

No price information available.
Free Trial
Free Version

Pricing Details

No price information available.
Free Trial
Free Version

Deployment

Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook

Deployment

Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook

Customer Support

Business Hours
Live Rep (24/7)
Online Support

Customer Support

Business Hours
Live Rep (24/7)
Online Support

Types of Training

Training Docs
Webinars
Live Training (Online)
In Person

Types of Training

Training Docs
Webinars
Live Training (Online)
In Person

Vendor Details

Company Name

OGP

Founded

1945

Country

United States

Website

www.ogpnet.com/products/software/metrology-software/elements/

Vendor Details

Company Name

OGP

Founded

1945

Country

United States

Website

www.ogpnet.com/products/software/metrology-software/vms/

Product Features

Product Features

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METROLOGIC Services