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support

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Description

In 30 minutes, you can monitor your entire warehouse. Automated warehouse-to-BI lineage can identify downstream impacts. Trust can be lost in seconds and regained in months. With modern data-era observability, you can have peace of mind. It can be difficult to get the coverage you need with code-based tests. They take hours to create and maintain. Metaplane allows you to add hundreds of tests in minutes. Foundational tests (e.g. We support foundational tests (e.g. row counts, freshness and schema drift), more complicated tests (distribution shifts, nullness shiftings, enum modifications), custom SQL, as well as everything in between. Manual thresholds can take a while to set and quickly become outdated as your data changes. Our anomaly detection algorithms use historical metadata to detect outliers. To minimize alert fatigue, monitor what is important, while also taking into account seasonality, trends and feedback from your team. You can also override manual thresholds.

Description

In response to the stringent quality requirements set by the automotive sector, semiconductor manufacturers are increasingly adopting Part Average Testing (PAT) to bolster the reliability of their products. This method focuses on identifying and eliminating "outlier" components that may pass conventional testing yet display unusual traits, thereby mitigating long-term quality and reliability concerns. By performing statistical analyses on a range of devices and modifying the pass/fail thresholds, PAT enables the early detection of these problematic parts, ensuring that only the highest quality components are included in production shipments. While Part Average Testing (PAT), as outlined in the Automotive Electronics Council AEC-Q001-Rev C specifications, primarily addresses DPM techniques for normal (Gaussian) distributions, many real-world scenarios involve distributions that do not conform to this norm. Consequently, it is essential to employ tailored PAT outlier detection strategies to prevent significant yield losses or erroneous identifications of outliers. To meet these challenges, PAT-Man emerges as a robust solution for implementing effective Part Average Testing (PAT). This innovative tool not only enhances the reliability of semiconductor components but also streamlines the testing process, ultimately benefiting manufacturers and consumers alike.

API Access

Has API No 

API Access

Has API No 

Screenshots View All

Screenshots View All

Integrations

Amazon Redshift Yes 
ClickHouse Yes 
Gmail Yes 
Google Cloud BigQuery Yes 
Looker Yes 
Metabase Yes 
Mode Yes 
MySQL Yes 
Okta Yes 
PagerDuty Yes 
PostgreSQL Yes 
SQL Server Yes 
Secoda Yes 
Sigma Yes 
Slack Yes 
Snowflake Yes 
Tableau Yes 
dbt Yes 

Integrations

Amazon Redshift No 
ClickHouse No 
Gmail No 
Google Cloud BigQuery No 
Looker No 
Metabase No 
Mode No 
MySQL No 
Okta No 
PagerDuty No 
PostgreSQL No 
SQL Server No 
Secoda No 
Sigma No 
Slack No 
Snowflake No 
Tableau No 
dbt No 

Pricing Details

$825 per month
Free Trial Yes 
Free Version Yes 

Pricing Details

No price information available.
Free Trial Yes 
Free Version No 

Deployment

Web-Based Yes 
On-Premises No 
iPhone App No 
iPad App No 
Android App No 
Windows No 
Mac No 
Linux No 
Chromebook No 

Deployment

Web-Based Yes 
On-Premises No 
iPhone App No 
iPad App No 
Android App No 
Windows No 
Mac No 
Linux No 
Chromebook No 

Customer Support

Business Hours No 
Live Rep (24/7) Yes 
Online Support Yes 

Customer Support

Business Hours No 
Live Rep (24/7) No 
Online Support Yes 

Types of Training

Training Docs Yes 
Webinars No 
Live Training (Online) Yes 
In Person No 

Types of Training

Training Docs Yes 
Webinars No 
Live Training (Online) Yes 
In Person Yes 

Vendor Details

Company Name

Metaplane

Country

United States

Website

www.metaplane.dev/

Vendor Details

Company Name

Galaxy

Country

United States

Website

www.galaxysemi.com/products/pat-man

Product Features

Data Lineage

Database Change Impact Analysis No 
Filter Lineage Links No 
Implicit Connection Discovery No 
Lineage Object Filtering No 
Object Lineage Tracing No 
Point-in-Time Visibility No 
User/Client/Target Connection Visibility No 
Visual & Text Lineage View No 

Data Quality

Address Validation No 
Data Deduplication No 
Data Discovery No 
Data Profililng No 
Master Data Management No 
Match & Merge No 
Metadata Management No 

Product Features

Engineering

2D Drawing No 
3D Modeling No 
Chemical Engineering No 
Civil Engineering No 
Collaboration No 
Design Analysis No 
Design Export No 
Document Management No 
Electrical Engineering No 
Mechanical Engineering No 
Mechatronics No 
Presentation Tools No 
Structural Engineering No 

Alternatives

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