Average Ratings 0 Ratings
Average Ratings 0 Ratings
Description
In 30 minutes, you can monitor your entire warehouse. Automated warehouse-to-BI lineage can identify downstream impacts. Trust can be lost in seconds and regained in months. With modern data-era observability, you can have peace of mind. It can be difficult to get the coverage you need with code-based tests. They take hours to create and maintain. Metaplane allows you to add hundreds of tests in minutes. Foundational tests (e.g. We support foundational tests (e.g. row counts, freshness and schema drift), more complicated tests (distribution shifts, nullness shiftings, enum modifications), custom SQL, as well as everything in between. Manual thresholds can take a while to set and quickly become outdated as your data changes. Our anomaly detection algorithms use historical metadata to detect outliers. To minimize alert fatigue, monitor what is important, while also taking into account seasonality, trends and feedback from your team. You can also override manual thresholds.
Description
In response to the stringent quality requirements set by the automotive sector, semiconductor manufacturers are increasingly adopting Part Average Testing (PAT) to bolster the reliability of their products. This method focuses on identifying and eliminating "outlier" components that may pass conventional testing yet display unusual traits, thereby mitigating long-term quality and reliability concerns. By performing statistical analyses on a range of devices and modifying the pass/fail thresholds, PAT enables the early detection of these problematic parts, ensuring that only the highest quality components are included in production shipments. While Part Average Testing (PAT), as outlined in the Automotive Electronics Council AEC-Q001-Rev C specifications, primarily addresses DPM techniques for normal (Gaussian) distributions, many real-world scenarios involve distributions that do not conform to this norm. Consequently, it is essential to employ tailored PAT outlier detection strategies to prevent significant yield losses or erroneous identifications of outliers. To meet these challenges, PAT-Man emerges as a robust solution for implementing effective Part Average Testing (PAT). This innovative tool not only enhances the reliability of semiconductor components but also streamlines the testing process, ultimately benefiting manufacturers and consumers alike.
API Access
Has API
No
API Access
Has API
No
Integrations
Amazon Redshift
Yes
ClickHouse
Yes
Gmail
Yes
Google Cloud BigQuery
Yes
Looker
Yes
Metabase
Yes
Mode
Yes
MySQL
Yes
Okta
Yes
PagerDuty
Yes
Integrations
Amazon Redshift
No
ClickHouse
No
Gmail
No
Google Cloud BigQuery
No
Looker
No
Metabase
No
Mode
No
MySQL
No
Okta
No
PagerDuty
No
Pricing Details
$825 per month
Free Trial
Yes
Free Version
Yes
Pricing Details
No price information available.
Free Trial
Yes
Free Version
No
Deployment
Web-Based
Yes
On-Premises
No
iPhone App
No
iPad App
No
Android App
No
Windows
No
Mac
No
Linux
No
Chromebook
No
Deployment
Web-Based
Yes
On-Premises
No
iPhone App
No
iPad App
No
Android App
No
Windows
No
Mac
No
Linux
No
Chromebook
No
Customer Support
Business Hours
No
Live Rep (24/7)
Yes
Online Support
Yes
Customer Support
Business Hours
No
Live Rep (24/7)
No
Online Support
Yes
Types of Training
Training Docs
Yes
Webinars
No
Live Training (Online)
Yes
In Person
No
Types of Training
Training Docs
Yes
Webinars
No
Live Training (Online)
Yes
In Person
Yes
Vendor Details
Company Name
Metaplane
Country
United States
Website
www.metaplane.dev/
Vendor Details
Company Name
Galaxy
Country
United States
Website
www.galaxysemi.com/products/pat-man
Product Features
Data Lineage
Database Change Impact Analysis
No
Filter Lineage Links
No
Implicit Connection Discovery
No
Lineage Object Filtering
No
Object Lineage Tracing
No
Point-in-Time Visibility
No
User/Client/Target Connection Visibility
No
Visual & Text Lineage View
No
Data Quality
Address Validation
No
Data Deduplication
No
Data Discovery
No
Data Profililng
No
Master Data Management
No
Match & Merge
No
Metadata Management
No
Product Features
Engineering
2D Drawing
No
3D Modeling
No
Chemical Engineering
No
Civil Engineering
No
Collaboration
No
Design Analysis
No
Design Export
No
Document Management
No
Electrical Engineering
No
Mechanical Engineering
No
Mechatronics
No
Presentation Tools
No
Structural Engineering
No