Compare Ansys Exalto vs. PathWave RFIC Design

Ansys Exalto serves as an advanced post-LVS RLCk extraction software that empowers integrated circuit (IC) designers to effectively address unknown crosstalk between various components within the design hierarchy by extracting lumped-element parasitics and creating precise models for electrical, magnetic, and substrate coupling. This tool seamlessly integrates with a wide range of LVS software and can enhance the performance of any RC extraction tool you prefer. With Ansys Exalto's post-LVS RLCk extraction capabilities, IC designers are equipped to make accurate predictions regarding electromagnetic and substrate coupling effects, allowing for signoff on circuits that may have previously been deemed "too complex to analyze." The models that are extracted can be back-annotated to the schematic or netlist, ensuring compatibility with all circuit simulators. As the prevalence of RF and high-speed circuits continues to rise in contemporary silicon systems, electromagnetic coupling has become a primary factor that necessitates precise modeling to ensure the successful fabrication of silicon. Overall, Ansys Exalto represents a crucial advancement in circuit design, helping engineers navigate the complexities associated with modern electronic systems.

Advance your approach to RF simulation by focusing on the comprehensive design, analysis, and verification of radio frequency integrated circuits (RFICs). Gain assurance through the use of steady-state and nonlinear solvers for both design and verification processes. The availability of wireless standard libraries expedites the validation of intricate RFICs. Prior to finalizing an RFIC, it is essential to confirm IC specifications through RF simulation. These simulations take into account various factors such as layout parasitics, intricate modulated signals, and digital control circuitry. With PathWave RFIC Design, you can perform simulations in both frequency and time domains, facilitating seamless transitions between your designs and Cadence Virtuoso. Achieve accurate modeling of components on silicon chips, and enhance your designs using optimization techniques like sweeps and load-pull analysis. Integration of RF designs into the Cadence Virtuoso environment is streamlined, while the implementation of Monte Carlo and yield analysis can significantly boost performance. Additionally, debugging is made easier with safe operating area alerts, allowing for immediate utilization of cutting-edge foundry technology to stay at the forefront of innovation. This holistic approach to RFIC design not only improves efficiency but also elevates the overall quality and reliability of the final products.