Average Ratings 0 Ratings
Average Ratings 0 Ratings
Description
Analyst XR is a cutting-edge software solution crafted by ScanTech Instruments designed for sophisticated C-scan corrosion mapping within non-destructive testing scenarios. It empowers users to create intricate 3D representations of pipes or vessels by seamlessly merging numerous scans, which allows for thorough examination and external review. With a user-friendly interface complemented by a calibration wizard, the software assists users in navigating their setup processes with precision. Additionally, real-time data monitoring facilitates on-the-spot adjustments during inspections, enhancing the efficiency of data collection. A notable feature is the re-gating function, which allows for modifications after scanning to remove any interference, thereby ensuring high accuracy in the resulting scan maps. Users can also take advantage of customizable reporting templates that support the generation of tailored reports, including various elements such as scan data, visuals, and explanatory text. Furthermore, Analyst XR conducts automated B31G analysis on the scan data, offering vital evaluations of structural integrity, which is crucial for maintaining safety and compliance in engineering assessments. Overall, Analyst XR not only streamlines the corrosion mapping process but also significantly improves the reliability of testing outcomes.
Description
JTAG Maps™, an intuitive Altium extension, allows engineers to quickly assess test possibilities provided by the JTAG devices in their design. Engineers used to spend hours manually highlighting boundary-scan nets in a design to determine coverage. Boundary scan device model files (BSDLs), which indicate exactly which pins can or cannot be controlled by JTAG/boundary scanning, are crucial to any JTAG/boundary scanner process. JTAG Maps is compatible with BSDL models, and has an 'assume scanner covered' option. Although most users will prefer to use the JTAG Maps Altium coverage report, it is possible import a more detailed picture. The data can be exported to JTAG ProVision for further analysis. A simple message file containing full fault-coverage information can then be read back into JTAG Maps for display/highlighting.
API Access
Has API
No
API Access
Has API
No
Integrations
Allegro X Design Platform
No
OrCAD X
No
Pricing Details
No price information available.
Free Trial
No
Free Version
No
Pricing Details
No price information available.
Free Trial
No
Free Version
Yes
Deployment
Web-Based
No
On-Premises
No
iPhone App
No
iPad App
No
Android App
No
Windows
Yes
Mac
No
Linux
No
Chromebook
No
Deployment
Web-Based
Yes
On-Premises
No
iPhone App
No
iPad App
No
Android App
No
Windows
No
Mac
No
Linux
No
Chromebook
No
Customer Support
Business Hours
Yes
Live Rep (24/7)
Yes
Online Support
Yes
Customer Support
Business Hours
No
Live Rep (24/7)
Yes
Online Support
No
Types of Training
Training Docs
Yes
Webinars
No
Live Training (Online)
Yes
In Person
Yes
Types of Training
Training Docs
No
Webinars
No
Live Training (Online)
No
In Person
No
Vendor Details
Company Name
Scantech Instruments
Founded
1997
Country
United States
Website
scanndt.com/products/ndt-software/analyst-xr-software-for-c-scanning/
Vendor Details
Company Name
Altium
Founded
1985
Country
United States
Website
www.altium.com/products/extensions/platform-extensions/jtag-maps/overview
Product Features
Product Features
PCB Design
3D Visualization
No
Autorouting
No
Collaboration Tools
No
Component Library
No
Design Rule Check
No
Differential Pair Routing
No
Schematic Editor
No