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Average Ratings 0 Ratings

Total
ease
features
design
support

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Write a Review

Description

Analyst X is an advanced software solution for data analysis created by ScanTech Instruments, specifically tailored for B-scan ultrasonic inspections within non-destructive testing scenarios. This powerful tool streamlines the reporting process by enabling users to generate both scan plans and B-scans effortlessly with a single click, while also allowing for the overlay of multiple B-scans, facilitating thorough comparative analysis. The software is capable of generating detailed data tables that present high, average, and low values for each scan, and features a re-gating function that allows for adjustments to scan data after collection, resulting in polished, clear scan maps. Additionally, it provides automated statistical analysis on the collected scan data to enhance insights. Analyst X is designed with a user-friendly interface that includes guided calibration assistance, ensuring a smooth calibration experience for users. It further supports automated data acquisition, offers adjustable gain modification either before or during scans, and provides real-time data monitoring with instant adjustment options, in addition to allowing scans to be paused and resumed seamlessly. This comprehensive functionality makes Analyst X an essential tool for professionals in the field.

Description

JTAG Maps™, an intuitive Altium extension, allows engineers to quickly assess test possibilities provided by the JTAG devices in their design. Engineers used to spend hours manually highlighting boundary-scan nets in a design to determine coverage. Boundary scan device model files (BSDLs), which indicate exactly which pins can or cannot be controlled by JTAG/boundary scanning, are crucial to any JTAG/boundary scanner process. JTAG Maps is compatible with BSDL models, and has an 'assume scanner covered' option. Although most users will prefer to use the JTAG Maps Altium coverage report, it is possible import a more detailed picture. The data can be exported to JTAG ProVision for further analysis. A simple message file containing full fault-coverage information can then be read back into JTAG Maps for display/highlighting.

API Access

Has API No 

API Access

Has API No 

Screenshots View All

Screenshots View All

Integrations

Allegro X Design Platform No 
OrCAD X No 

Integrations

Allegro X Design Platform Yes 
OrCAD X Yes 

Pricing Details

No price information available.
Free Trial No 
Free Version No 

Pricing Details

No price information available.
Free Trial No 
Free Version Yes 

Deployment

Web-Based No 
On-Premises No 
iPhone App No 
iPad App No 
Android App No 
Windows Yes 
Mac No 
Linux No 
Chromebook No 

Deployment

Web-Based Yes 
On-Premises No 
iPhone App No 
iPad App No 
Android App No 
Windows No 
Mac No 
Linux No 
Chromebook No 

Customer Support

Business Hours Yes 
Live Rep (24/7) Yes 
Online Support Yes 

Customer Support

Business Hours No 
Live Rep (24/7) Yes 
Online Support No 

Types of Training

Training Docs Yes 
Webinars No 
Live Training (Online) Yes 
In Person Yes 

Types of Training

Training Docs No 
Webinars No 
Live Training (Online) No 
In Person No 

Vendor Details

Company Name

Scantech Instruments

Founded

1997

Country

United States

Website

scanndt.com/products/ndt-software/analyst-x-software-for-b-scanning/

Vendor Details

Company Name

Altium

Founded

1985

Country

United States

Website

www.altium.com/products/extensions/platform-extensions/jtag-maps/overview

Product Features

PCB Design

3D Visualization No 
Autorouting No 
Collaboration Tools No 
Component Library No 
Design Rule Check No 
Differential Pair Routing No 
Schematic Editor No 

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