Average Ratings 0 Ratings
Average Ratings 0 Ratings
Description
Analyst X is an advanced software solution for data analysis created by ScanTech Instruments, specifically tailored for B-scan ultrasonic inspections within non-destructive testing scenarios. This powerful tool streamlines the reporting process by enabling users to generate both scan plans and B-scans effortlessly with a single click, while also allowing for the overlay of multiple B-scans, facilitating thorough comparative analysis. The software is capable of generating detailed data tables that present high, average, and low values for each scan, and features a re-gating function that allows for adjustments to scan data after collection, resulting in polished, clear scan maps. Additionally, it provides automated statistical analysis on the collected scan data to enhance insights. Analyst X is designed with a user-friendly interface that includes guided calibration assistance, ensuring a smooth calibration experience for users. It further supports automated data acquisition, offers adjustable gain modification either before or during scans, and provides real-time data monitoring with instant adjustment options, in addition to allowing scans to be paused and resumed seamlessly. This comprehensive functionality makes Analyst X an essential tool for professionals in the field.
Description
JTAG Maps™, an intuitive Altium extension, allows engineers to quickly assess test possibilities provided by the JTAG devices in their design. Engineers used to spend hours manually highlighting boundary-scan nets in a design to determine coverage. Boundary scan device model files (BSDLs), which indicate exactly which pins can or cannot be controlled by JTAG/boundary scanning, are crucial to any JTAG/boundary scanner process. JTAG Maps is compatible with BSDL models, and has an 'assume scanner covered' option. Although most users will prefer to use the JTAG Maps Altium coverage report, it is possible import a more detailed picture. The data can be exported to JTAG ProVision for further analysis. A simple message file containing full fault-coverage information can then be read back into JTAG Maps for display/highlighting.
API Access
Has API
API Access
Has API
Integrations
Allegro X Design Platform
OrCAD X
Pricing Details
No price information available.
Free Trial
Free Version
Pricing Details
No price information available.
Free Trial
Free Version
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Deployment
Web-Based
On-Premises
iPhone App
iPad App
Android App
Windows
Mac
Linux
Chromebook
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Customer Support
Business Hours
Live Rep (24/7)
Online Support
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Types of Training
Training Docs
Webinars
Live Training (Online)
In Person
Vendor Details
Company Name
Scantech Instruments
Founded
1997
Country
United States
Website
scanndt.com/products/ndt-software/analyst-x-software-for-b-scanning/
Vendor Details
Company Name
Altium
Founded
1985
Country
United States
Website
www.altium.com/products/extensions/platform-extensions/jtag-maps/overview
Product Features
Product Features
PCB Design
3D Visualization
Autorouting
Collaboration Tools
Component Library
Design Rule Check
Differential Pair Routing
Schematic Editor